SN74ABT18640DLR Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN TEST DEVICE 18BIT 56SSOP
Packaging: Bulk
Package / Case: 56-BSSOP (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 18
Logic Type: Scan Test Device with Inverting Bus Transceivers
Operating Temperature: -40°C ~ 85°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 56-SSOP
Part Status: Obsolete
auf Bestellung 2000 Stücke:
Lieferzeit 21-28 Tag (e)
| Anzahl | Preis ohne MwSt |
|---|---|
| 24+ | 32.71 EUR |
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Technische Details SN74ABT18640DLR Texas Instruments
Description: IC SCAN TEST DEVICE 18BIT 56SSOP, Packaging: Tape & Reel (TR), Package / Case: 56-BSSOP (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 18, Logic Type: Scan Test Device with Inverting Bus Transceivers, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 56-SSOP, Part Status: Obsolete.
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SN74ABT18640DLR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE 18BIT 56SSOP Packaging: Tape & Reel (TR) Package / Case: 56-BSSOP (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 18 Logic Type: Scan Test Device with Inverting Bus Transceivers Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 56-SSOP Part Status: Obsolete |
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