SN74BCT8240ADWR Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN TEST DEVICE BUFF 24-SOIC
Packaging: Bulk
Package / Case: 24-SOIC (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Inverting Buffers
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-SOIC
auf Bestellung 30000 Stücke:
Lieferzeit 21-28 Tag (e)
| Anzahl | Preis ohne MwSt |
|---|---|
| 41+ | 17.84 EUR |
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Technische Details SN74BCT8240ADWR Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-SOIC, Packaging: Tape & Reel (TR), Package / Case: 24-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Inverting Buffers, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-SOIC.
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SN74BCT8240ADWR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE BUFF 24-SOIC Packaging: Tape & Reel (TR) Package / Case: 24-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Inverting Buffers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-SOIC |
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