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HC2000 CG04 L

HC2000 CG04 L EQUIP-TEST

HC2000 CG04 L.pdf
Hersteller: EQUIP-TEST
Category: Contact Probes
Description: Test needle; Spring compression: 4.4mm; 5.5mm; Min.pitch: 5.08mm
Contact material: beryllium copper
Type of test accessories: test needle
Contact plating: gold-plated
Blade tip shape: head CG
Operating temperature: -40...250°C
Tip diameter: 4mm
Operational spring compression: 4.4mm
Minimum pitch: 5.08mm
Maksimum spring compression: 5.5mm
Max. contact resistance:: 10mΩ
Overall length: 38.5mm
Current rating: 50A
Spring compression force: 3N
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Technische Details HC2000 CG04 L EQUIP-TEST

Category: Contact Probes, Description: Test needle; Spring compression: 4.4mm; 5.5mm; Min.pitch: 5.08mm, Contact material: beryllium copper, Type of test accessories: test needle, Contact plating: gold-plated, Blade tip shape: head CG, Operating temperature: -40...250°C, Tip diameter: 4mm, Operational spring compression: 4.4mm, Minimum pitch: 5.08mm, Maksimum spring compression: 5.5mm, Max. contact resistance:: 10mΩ, Overall length: 38.5mm, Current rating: 50A, Spring compression force: 3N.