SN74BCT8240ANT Texas Instruments
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Inverting Buffers
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Inverting Buffers
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
auf Bestellung 1404 Stücke:
Lieferzeit 21-28 Tag (e)
Anzahl | Preis ohne MwSt |
---|---|
41+ | 17.84 EUR |
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Technische Details SN74BCT8240ANT Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP, Packaging: Tube, Package / Case: 24-DIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with Inverting Buffers, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-PDIP.
Weitere Produktangebote SN74BCT8240ANT
Foto | Bezeichnung | Hersteller | Beschreibung |
Verfügbarkeit |
Preis ohne MwSt |
---|---|---|---|---|---|
SN74BCT8240ANT | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE BUFF 24-DIP Packaging: Tube Package / Case: 24-DIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Inverting Buffers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-PDIP |
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