SN74BCT8240ANT Texas Instruments
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Supplier Device Package: 24-PDIP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with Inverting Buffers
Number of Bits: 8
Mounting Type: Through Hole
Package / Case: 24-DIP (0.300", 7.62mm)
Packaging: Tube
| Anzahl | Preis |
|---|---|
| 41+ | 12.07 EUR |
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Technische Details SN74BCT8240ANT Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP, Supplier Device Package: 24-PDIP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: 0°C ~ 70°C, Logic Type: Scan Test Device with Inverting Buffers, Number of Bits: 8, Mounting Type: Through Hole, Package / Case: 24-DIP (0.300", 7.62mm), Packaging: Tube.
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SN74BCT8240ANT | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE BUFF 24-DIP Packaging: Tube Package / Case: 24-DIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Inverting Buffers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-PDIP |
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