SN74BCT8373ANT Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN TEST DEVICE LATCH 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Latches
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
auf Bestellung 2169 Stücke:
Lieferzeit 21-28 Tag (e)
| Anzahl | Preis ohne MwSt |
|---|---|
| 50+ | 14.45 EUR |
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Technische Details SN74BCT8373ANT Texas Instruments
Description: IC SCAN TEST DEVICE LATCH 24-DIP, Packaging: Tube, Package / Case: 24-DIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with D-Type Latches, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-PDIP.
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SN74BCT8373ANT | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE LATCH 24-DIP Packaging: Tube Package / Case: 24-DIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with D-Type Latches Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-PDIP |
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