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SN74BCT8373ANT

SN74BCT8373ANT Texas Instruments

sn54bct8373a.pdf
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE LATCH 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Latches
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
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Technische Details SN74BCT8373ANT Texas Instruments

Description: IC SCAN TEST DEVICE LATCH 24-DIP, Packaging: Tube, Package / Case: 24-DIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with D-Type Latches, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-PDIP.

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SN74BCT8373ANT SN74BCT8373ANT Texas Instruments sn54bct8373a.pdf Description: IC SCAN TEST DEVICE LATCH 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Latches
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
Produkt ist nicht verfügbar
Im Einkaufswagen  Stück im Wert von  UAH
SN74BCT8373ANT sn54bct8373a.pdf
SN74BCT8373ANT
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE LATCH 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Latches
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
Produkt ist nicht verfügbar
Im Einkaufswagen  Stück im Wert von  UAH