SN74ABT8245DWR Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN TEST DEV W/OBT 24-SOIC
Packaging: Bulk
Package / Case: 24-SOIC (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Bus Transceivers
Operating Temperature: -40°C ~ 85°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-SOIC
auf Bestellung 1850 Stücke:
Lieferzeit 10-14 Tag (e)
| Anzahl | Preis |
|---|---|
| 78+ | 6.30 EUR |
Produktrezensionen
Produktbewertung abgeben
Technische Details SN74ABT8245DWR Texas Instruments
Description: IC SCAN TEST DEV W/OBT 24-SOIC, Packaging: Tape & Reel (TR), Package / Case: 24-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Bus Transceivers, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-SOIC.
Weitere Produktangebote SN74ABT8245DWR
| Foto | Bezeichnung | Hersteller | Beschreibung |
Verfügbarkeit |
Preis |
|---|---|---|---|---|---|
| SN74ABT8245DWR |
|
auf Bestellung 928 Stücke: Lieferzeit 21-28 Tag (e) |
|||
 |
SN74ABT8245DWR | Hersteller : Texas Instruments |
Scan Test Device -40C to 85C 24-Pin SOIC T/R |
Produkt ist nicht verfügbar |
|
|
|
SN74ABT8245DWR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEV W/OBT 24-SOIC Packaging: Cut Tape (CT) Package / Case: 24-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceivers Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-SOIC |
Produkt ist nicht verfügbar |
|
|
|
SN74ABT8245DWR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEV W/OBT 24-SOIC Packaging: Tape & Reel (TR) Package / Case: 24-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceivers Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-SOIC |
Produkt ist nicht verfügbar |
|
 |
SN74ABT8245DWR | Hersteller : Texas Instruments |
Specialty Function Logic Scan Test Device |
Produkt ist nicht verfügbar |