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SN74ABT8543DWR Texas Instruments

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Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE 28-SOIC
Logic Type: Scan Test Device with Registered Bus Transceiver
Number of Bits: 8
Mounting Type: Surface Mount
Package / Case: 28-SOIC (0.295", 7.50mm Width)
Packaging: Tape & Reel (TR)
Supplier Device Package: 28-SOIC
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: -40°C ~ 85°C

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Technische Details SN74ABT8543DWR Texas Instruments

Description: IC SCAN TEST DEVICE 28-SOIC, Logic Type: Scan Test Device with Registered Bus Transceiver, Number of Bits: 8, Mounting Type: Surface Mount, Package / Case: 28-SOIC (0.295", 7.50mm Width), Packaging: Tape & Reel (TR), Supplier Device Package: 28-SOIC, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: -40°C ~ 85°C.