
SN74ABT8652DWR Texas Instruments

Description: IC SCAN TEST DEVICE 28-SOIC
Packaging: Bulk
Package / Case: 28-SOIC (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Bus Transceiver and Registers
Operating Temperature: -40°C ~ 85°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-SOIC
auf Bestellung 1000 Stücke:
Lieferzeit 10-14 Tag (e)
Anzahl | Preis |
---|---|
32+ | 15.36 EUR |
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Technische Details SN74ABT8652DWR Texas Instruments
Description: IC SCAN TEST DEVICE 28-SOIC, Packaging: Tape & Reel (TR), Package / Case: 28-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Bus Transceiver and Registers, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-SOIC.
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SN74ABT8652DWR | Hersteller : Texas Instruments |
![]() Packaging: Tape & Reel (TR) Package / Case: 28-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceiver and Registers Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 28-SOIC |
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