Produkte > TEXAS INSTRUMENTS > SN74ABT8952DL
SN74ABT8952DL

SN74ABT8952DL Texas Instruments


SN54ABT8952_SN74ABT8952.pdf
Hersteller: Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 28-SSOP
Package / Case: 28-BSSOP (0.295", 7.50mm Width)
Packaging: Tube
Supplier Device Package: 28-BSSOP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: -40°C ~ 85°C
Logic Type: Scan Test Device with Registered Bus Transceiver
Number of Bits: 8
Mounting Type: Surface Mount
auf Bestellung 17833 Stücke:

Lieferzeit 10-14 Tag (e)
Anzahl Preis
39+12.68 EUR
Mindestbestellmenge: 39
Im Einkaufswagen  Stück im Wert von  UAH
Produktrezensionen
Produktbewertung abgeben

Technische Details SN74ABT8952DL Texas Instruments

Description: IC SCAN-TEST-DEV/XCVR 28-SSOP, Package / Case: 28-BSSOP (0.295", 7.50mm Width), Packaging: Tube, Supplier Device Package: 28-BSSOP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: -40°C ~ 85°C, Logic Type: Scan Test Device with Registered Bus Transceiver, Number of Bits: 8, Mounting Type: Surface Mount.