SN74ABT8952DW Texas Instruments
Hersteller: Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 28-SOIC
Supplier Device Package: 28-SOIC
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: -40°C ~ 85°C
Logic Type: Scan Test Device with Registered Bus Transceiver
Number of Bits: 8
Mounting Type: Surface Mount
Package / Case: 28-SOIC (0.295", 7.50mm Width)
Packaging: Tube
| Anzahl | Preis |
|---|---|
| 45+ | 11.01 EUR |
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Technische Details SN74ABT8952DW Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 28-SOIC, Supplier Device Package: 28-SOIC, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: -40°C ~ 85°C, Logic Type: Scan Test Device with Registered Bus Transceiver, Number of Bits: 8, Mounting Type: Surface Mount, Package / Case: 28-SOIC (0.295", 7.50mm Width), Packaging: Tube.
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SN74ABT8952DW | Hersteller : Texas Instruments |
Description: IC SCAN-TEST-DEV/XCVR 28-SOIC Packaging: Tube Package / Case: 28-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Registered Bus Transceiver Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 28-SOIC |
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