SN74ABT8952DW Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN-TEST-DEV/XCVR 28-SOIC
Packaging: Tube
Package / Case: 28-SOIC (0.295", 7.50mm Width)
Mounting Type: Surface Mount
Number of Bits: 8
Logic Type: Scan Test Device with Registered Bus Transceiver
Operating Temperature: -40°C ~ 85°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 28-SOIC
auf Bestellung 5920 Stücke:
Lieferzeit 10-14 Tag (e)
| Anzahl | Preis |
|---|---|
| 45+ | 11.01 EUR |
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Technische Details SN74ABT8952DW Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 28-SOIC, Packaging: Tube, Package / Case: 28-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Registered Bus Transceiver, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-SOIC.
Weitere Produktangebote SN74ABT8952DW
| Foto | Bezeichnung | Hersteller | Beschreibung |
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SN74ABT8952DW | Hersteller : Texas Instruments |
Scan Test Device |
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SN74ABT8952DW | Hersteller : Texas Instruments |
Description: IC SCAN-TEST-DEV/XCVR 28-SOIC Packaging: Tube Package / Case: 28-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Registered Bus Transceiver Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 28-SOIC |
Produkt ist nicht verfügbar |