SN74BCT8244ANTG4 Texas Instruments
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP
Supplier Device Package: 24-PDIP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with Buffers
Number of Bits: 8
Mounting Type: Through Hole
Package / Case: 24-DIP (0.300", 7.62mm)
Packaging: Tube
Produktrezensionen
Produktbewertung abgeben
Technische Details SN74BCT8244ANTG4 Texas Instruments
Description: IC SCAN TEST DEVICE BUFF 24-DIP, Supplier Device Package: 24-PDIP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: 0°C ~ 70°C, Logic Type: Scan Test Device with Buffers, Number of Bits: 8, Mounting Type: Through Hole, Package / Case: 24-DIP (0.300", 7.62mm), Packaging: Tube.