Technische Details SN74BCT8374ADW Texas Instruments
Description: IC SCAN TEST DEVICE 8BIT 24-SOIC, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: 0°C ~ 70°C, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Number of Bits: 8, Mounting Type: Surface Mount, Package / Case: 24-SOIC (0.295", 7.50mm Width), Packaging: Tube, Supplier Device Package: 24-SOIC, Part Status: Active.
Weitere Produktangebote SN74BCT8374ADW nach Preis ab 9.83 EUR bis 24.75 EUR
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SN74BCT8374ADW | Texas Instruments |
 Scan Test Device 0°C to 70°C 24-Pin SOIC Tube |
auf Bestellung 25 Stücke: Lieferzeit 14-21 Tag (e) |
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SN74BCT8374ADW | Texas Instruments |
Description: IC SCAN TEST DEVICE 8BIT 24-SOIC Supply Voltage: 4.5V ~ 5.5V Operating Temperature: 0°C ~ 70°C Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops Number of Bits: 8 Mounting Type: Surface Mount Package / Case: 24-SOIC (0.295", 7.50mm Width) Packaging: Tube Supplier Device Package: 24-SOIC Part Status: Active |
auf Bestellung 34 Stücke: Lieferzeit 10-14 Tag (e) |
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SN74BCT8374ADW | Texas Instruments |
Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop |
auf Bestellung 68 Stücke: Lieferzeit 10-14 Tag (e) |
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auf Bestellung 25 Stücke: Lieferzeit 21-28 Tag (e) |
Im Einkaufswagen Stück im Wert von UAH |
| SN74BCT8374ADW |
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Hersteller: Texas Instruments
Scan Test Device 0°C to 70°C 24-Pin SOIC Tube
Scan Test Device 0°C to 70°C 24-Pin SOIC Tube
auf Bestellung 25 Stücke:
Lieferzeit 14-21 Tag (e)
| Anzahl | Privatkunde |
|---|---|
| 25+ | 9.83 EUR |
| SN74BCT8374ADW |
|
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE 8BIT 24-SOIC
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Number of Bits: 8
Mounting Type: Surface Mount
Package / Case: 24-SOIC (0.295", 7.50mm Width)
Packaging: Tube
Supplier Device Package: 24-SOIC
Part Status: Active
Description: IC SCAN TEST DEVICE 8BIT 24-SOIC
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Number of Bits: 8
Mounting Type: Surface Mount
Package / Case: 24-SOIC (0.295", 7.50mm Width)
Packaging: Tube
Supplier Device Package: 24-SOIC
Part Status: Active
auf Bestellung 34 Stücke:
Lieferzeit 10-14 Tag (e)
| Anzahl | Privatkunde |
|---|---|
| 1+ | 24.69 EUR |
| 10+ | 19.46 EUR |
| 25+ | 18.15 EUR |
| SN74BCT8374ADW |
|
Hersteller: Texas Instruments
Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop
Specialty Function Logic Device w/Octal D-Typ Edge-Trig Flip-Flop
auf Bestellung 68 Stücke:
Lieferzeit 10-14 Tag (e)
| Anzahl | Privatkunde |
|---|---|
| 1+ | 24.75 EUR |
| 10+ | 19.5 EUR |
| 25+ | 18.2 EUR |
| 100+ | 17.64 EUR |
| 250+ | 17.2 EUR |
| 500+ | 16.67 EUR |
| 1000+ | 16.15 EUR |
| SN74BCT8374ADW |
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auf Bestellung 25 Stücke:
Lieferzeit 21-28 Tag (e)