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SN74BCT8374ADWR Texas Instruments

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Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE 8BIT 24-SOIC
Supplier Device Package: 24-SOIC
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Number of Bits: 8
Mounting Type: Surface Mount
Package / Case: 24-SOIC (0.295", 7.50mm Width)
Packaging: Tape & Reel (TR)

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Technische Details SN74BCT8374ADWR Texas Instruments

Description: IC SCAN TEST DEVICE 8BIT 24-SOIC, Supplier Device Package: 24-SOIC, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: 0°C ~ 70°C, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Number of Bits: 8, Mounting Type: Surface Mount, Package / Case: 24-SOIC (0.295", 7.50mm Width), Packaging: Tape & Reel (TR).