SN74BCT8374ANT Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN TEST DEVICE W/FF 24-DIP
Packaging: Tube
Package / Case: 24-DIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Operating Temperature: 0°C ~ 70°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-PDIP
auf Bestellung 75 Stücke:
Lieferzeit 10-14 Tag (e)
| Anzahl | Preis |
|---|---|
| 75+ | 6.55 EUR |
Produktrezensionen
Produktbewertung abgeben
Technische Details SN74BCT8374ANT Texas Instruments
Description: IC SCAN TEST DEVICE W/FF 24-DIP, Packaging: Tube, Package / Case: 24-DIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-PDIP.
Weitere Produktangebote SN74BCT8374ANT
| Foto | Bezeichnung | Hersteller | Beschreibung |
Verfügbarkeit |
Preis |
|---|---|---|---|---|---|
| SN74BCT8374ANT |
|
auf Bestellung 4301 Stücke: Lieferzeit 21-28 Tag (e) |
|||
|
|
SN74BCT8374ANT | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE W/FF 24-DIP Packaging: Tube Package / Case: 24-DIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-PDIP |
Produkt ist nicht verfügbar |