SN74LVTH18502APMG4 Texas Instruments
Hersteller: Texas InstrumentsDescription: IC SCAN-TEST-DEV/XCVR 64-LQFP
Packaging: Tray
Package / Case: 64-LQFP
Mounting Type: Surface Mount
Logic Type: ABT Scan Test Device With Universal Bus Transceivers
Operating Temperature: -40°C ~ 85°C
Supplier Device Package: 64-LQFP (10x10)
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Technische Details SN74LVTH18502APMG4 Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 64-LQFP, Packaging: Tray, Package / Case: 64-LQFP, Mounting Type: Surface Mount, Logic Type: ABT Scan Test Device With Universal Bus Transceivers, Operating Temperature: -40°C ~ 85°C, Supplier Device Package: 64-LQFP (10x10).