Technische Details SN74LVTH18502APMG4 Texas Instruments
Description: IC SCAN-TEST-DEV/XCVR 64-LQFP, Packaging: Tray, Package / Case: 64-LQFP, Mounting Type: Surface Mount, Logic Type: ABT Scan Test Device With Universal Bus Transceivers, Operating Temperature: -40°C ~ 85°C, Supplier Device Package: 64-LQFP (10x10).
Weitere Produktangebote SN74LVTH18502APMG4
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SN74LVTH18502APMG4 | Hersteller : Texas Instruments |
 Description: IC SCAN-TEST-DEV/XCVR 64-LQFPPackaging: Tray Package / Case: 64-LQFP Mounting Type: Surface Mount Logic Type: ABT Scan Test Device With Universal Bus Transceivers Operating Temperature: -40°C ~ 85°C Supplier Device Package: 64-LQFP (10x10) |
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