Technische Details SNJ54BCT8373AFK Texas Instruments
Description: SCAN TEST DEVICES WITH OCTAL D-T, Packaging: Tube, Package / Case: 28-CLCC, Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with D-Type Latches, Operating Temperature: -55°C ~ 125°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 28-LCCC (11.43x11.43).
Weitere Produktangebote SNJ54BCT8373AFK
| Foto | Bezeichnung | Hersteller | Beschreibung |
Verfügbarkeit |
Preis |
|---|---|---|---|---|---|
| SNJ54BCT8373AFK | Hersteller : Texas Instruments |
 Description: SCAN TEST DEVICES WITH OCTAL D-TPackaging: Tube Package / Case: 28-CLCC Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with D-Type Latches Operating Temperature: -55°C ~ 125°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 28-LCCC (11.43x11.43) |
auf Bestellung 1331 Stücke: Lieferzeit 10-14 Tag (e) |