Technische Details SN74ABT18640DGGR Texas Instruments
Description: IC SCAN-TEST-DEV/TXRX 56-TSSOP, Packaging: Tape & Reel (TR), Package / Case: 56-TFSOP (0.240", 6.10mm Width), Mounting Type: Surface Mount, Number of Bits: 18, Logic Type: Scan Test Device with Inverting Bus Transceivers, Operating Temperature: -40°C ~ 85°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 56-TSSOP, Part Status: Obsolete.
Weitere Produktangebote SN74ABT18640DGGR
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SN74ABT18640DGGR | Hersteller : Texas Instruments |
 Description: IC SCAN-TEST-DEV/TXRX 56-TSSOPPackaging: Cut Tape (CT) Package / Case: 56-TFSOP (0.240", 6.10mm Width) Mounting Type: Surface Mount Number of Bits: 18 Logic Type: Scan Test Device with Inverting Bus Transceivers Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 56-TSSOP Part Status: Obsolete |
Produkt ist nicht verfügbar |
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SN74ABT18640DGGR | Hersteller : Texas Instruments |
Description: IC SCAN-TEST-DEV/TXRX 56-TSSOP Packaging: Tape & Reel (TR) Package / Case: 56-TFSOP (0.240", 6.10mm Width) Mounting Type: Surface Mount Number of Bits: 18 Logic Type: Scan Test Device with Inverting Bus Transceivers Operating Temperature: -40°C ~ 85°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 56-TSSOP Part Status: Obsolete |
Produkt ist nicht verfügbar |