Technische Details SN74BCT8245ADWR TEXAS INST
Description: IC SCAN TEST DEVICE TXRX 24-SOIC, Packaging: Tape & Reel (TR), Package / Case: 24-SOIC (0.295", 7.50mm Width), Mounting Type: Surface Mount, Number of Bits: 8, Logic Type: Scan Test Device with Bus Transceivers, Operating Temperature: 0°C ~ 70°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-SOIC.
Weitere Produktangebote SN74BCT8245ADWR
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SN74BCT8245ADWR | Hersteller : Texas Instruments |
 Bus XCVR Single 8-CH 3-ST 24-Pin SOIC T/R |
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SN74BCT8245ADWR | Hersteller : Texas Instruments |
Bus XCVR Single 8-CH 3-ST 24-Pin SOIC T/R |
Produkt ist nicht verfügbar |
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SN74BCT8245ADWR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE TXRX 24-SOIC Packaging: Tape & Reel (TR) Package / Case: 24-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceivers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-SOIC |
Produkt ist nicht verfügbar |
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SN74BCT8245ADWR | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE TXRX 24-SOIC Packaging: Cut Tape (CT) Package / Case: 24-SOIC (0.295", 7.50mm Width) Mounting Type: Surface Mount Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceivers Operating Temperature: 0°C ~ 70°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-SOIC |
Produkt ist nicht verfügbar |
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SN74BCT8245ADWR | Hersteller : Texas Instruments |
Specialty Function Logic Device w/Octal Bus T ransceiver A 595-SN A 595-SN74BCT8245ADW |
Produkt ist nicht verfügbar |