SN74BCT8245ANT Texas Instruments
Hersteller: Texas Instruments
Description: IC SCAN TEST DEVICE TXRX 24-DIP
Supplier Device Package: 24-PDIP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: 0°C ~ 70°C
Logic Type: Scan Test Device with Bus Transceivers
Number of Bits: 8
Mounting Type: Through Hole
Package / Case: 24-DIP (0.300", 7.62mm)
Packaging: Tube
| Anzahl | Preis |
|---|---|
| 30+ | 16.44 EUR |
Produktrezensionen
Produktbewertung abgeben
Technische Details SN74BCT8245ANT Texas Instruments
Description: IC SCAN TEST DEVICE TXRX 24-DIP, Supplier Device Package: 24-PDIP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: 0°C ~ 70°C, Logic Type: Scan Test Device with Bus Transceivers, Number of Bits: 8, Mounting Type: Through Hole, Package / Case: 24-DIP (0.300", 7.62mm), Packaging: Tube.
Weitere Produktangebote SN74BCT8245ANT
| Foto | Bezeichnung | Hersteller | Beschreibung |
Verfügbarkeit |
Preis |
|---|---|---|---|---|---|
|
SN74BCT8245ANT | Hersteller : Texas Instruments |
Description: IC SCAN TEST DEVICE TXRX 24-DIPSupplier Device Package: 24-PDIP Supply Voltage: 4.5V ~ 5.5V Operating Temperature: 0°C ~ 70°C Logic Type: Scan Test Device with Bus Transceivers Number of Bits: 8 Mounting Type: Through Hole Package / Case: 24-DIP (0.300", 7.62mm) Packaging: Tube |
Produkt ist nicht verfügbar |