Technische Details SNJ54ABT8245JT TI
Description: SCAN TEST DEVICES WITH OCTAL BUS, Packaging: Tube, Package / Case: 24-CDIP (0.300", 7.62mm), Mounting Type: Through Hole, Number of Bits: 8, Logic Type: Scan Test Device with Bus Transceivers, Operating Temperature: -55°C ~ 125°C, Supply Voltage: 4.5V ~ 5.5V, Supplier Device Package: 24-CDIP.
Weitere Produktangebote SNJ54ABT8245JT
| Foto | Bezeichnung | Hersteller | Beschreibung | Verfügbarkeit | Privatkunde |
|---|---|---|---|---|---|
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SNJ54ABT8245JT | Texas Instruments |
 Description: SCAN TEST DEVICES WITH OCTAL BUSPackaging: Tube Package / Case: 24-CDIP (0.300", 7.62mm) Mounting Type: Through Hole Number of Bits: 8 Logic Type: Scan Test Device with Bus Transceivers Operating Temperature: -55°C ~ 125°C Supply Voltage: 4.5V ~ 5.5V Supplier Device Package: 24-CDIP |
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| SNJ54ABT8245JT |
|
Hersteller: Texas Instruments
Description: SCAN TEST DEVICES WITH OCTAL BUS
Packaging: Tube
Package / Case: 24-CDIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Bus Transceivers
Operating Temperature: -55°C ~ 125°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-CDIP
Description: SCAN TEST DEVICES WITH OCTAL BUS
Packaging: Tube
Package / Case: 24-CDIP (0.300", 7.62mm)
Mounting Type: Through Hole
Number of Bits: 8
Logic Type: Scan Test Device with Bus Transceivers
Operating Temperature: -55°C ~ 125°C
Supply Voltage: 4.5V ~ 5.5V
Supplier Device Package: 24-CDIP
Produkt ist nicht verfügbar
Im Einkaufswagen
Stück im Wert von UAH