Technische Details SNJ54BCT8374AJT TI
Description: SCAN TEST DEVICES WITH OCTAL D-T, Supplier Device Package: 24-CDIP, Supply Voltage: 4.5V ~ 5.5V, Operating Temperature: -55°C ~ 125°C, Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops, Number of Bits: 8, Mounting Type: Through Hole, Package / Case: 24-CDIP (0.300", 7.62mm), Packaging: Tube.
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| Foto | Bezeichnung | Hersteller | Beschreibung | Verfügbarkeit | Preis |
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SNJ54BCT8374AJT | Texas Instruments |
 Description: SCAN TEST DEVICES WITH OCTAL D-TSupplier Device Package: 24-CDIP Supply Voltage: 4.5V ~ 5.5V Operating Temperature: -55°C ~ 125°C Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops Number of Bits: 8 Mounting Type: Through Hole Package / Case: 24-CDIP (0.300", 7.62mm) Packaging: Tube |
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| SNJ54BCT8374AJT |
|
Hersteller: Texas Instruments
Description: SCAN TEST DEVICES WITH OCTAL D-T
Supplier Device Package: 24-CDIP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: -55°C ~ 125°C
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Number of Bits: 8
Mounting Type: Through Hole
Package / Case: 24-CDIP (0.300", 7.62mm)
Packaging: Tube
Description: SCAN TEST DEVICES WITH OCTAL D-T
Supplier Device Package: 24-CDIP
Supply Voltage: 4.5V ~ 5.5V
Operating Temperature: -55°C ~ 125°C
Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
Number of Bits: 8
Mounting Type: Through Hole
Package / Case: 24-CDIP (0.300", 7.62mm)
Packaging: Tube
Produkt ist nicht verfügbar
Im Einkaufswagen
Stück im Wert von UAH